New JEOL JSM-6490LV High-performance variable pressure SEM

Thomas Freeman, Ph.D., NDSU professor of plant pathology and director of the NDSU Electron Microscopy Center, has been awarded $287,690 in a Major Research Instrumentation grant from the National Science Foundation to improve instrumentation for quality electron microscopy imaging and analysis.  The grant allows NDSU to acquire a new low-vacuum scanning electron microscope (SEM) permitting remote imaging and control.  "Acquiring this state-of-the-art microscope will strengthen ongoing research projects in the NDSU Electron Microscopy Center," said Freeman.  It will allow completion of significant portions of research that previously were unachievable because of lack of instrumentation, and it also will stimulate new research efforts in nanoscience, biological sciences, engineering, and polymers and coatings.  Here's what the new microscope can do:

• Flexible:  built-in high- and low-vacuum modes
• Effective surface characterization of samples ranging from fresh biological materials to polymers, coatings, and nanomaterials
• Minimal processing artifacts and sample alteration--reduced need for conductive coating
• Web-based capability over a standard internet connection, without special software.  This makes it possible to view and/or operate the electron microscope at your location--perfect for classroom teachers and others.

The instrument was installed in spring/summer 2007 through support of the NSF Major Research Instrumentation program, proposal number 0619098.

E-Mail:ndsu.em.center@ndsu.edu
Department of Plant Pathology
Northern Crop Science Laboratory
1307 N. 18 St.
North Dakota State University, Fargo, ND 58105
Phone: 701-231-8435