Materials Characterization and
Analysis Laboratory(MCAL)

Overview

The Materials Characterization and Analysis Laboratory (MCAL) within the NDSU Center for Nanoscale Science and Engineering (CNSE) is composed of instrumentation clusters aimed at providing critical insight into the chemical and physical properties of a wide range of materials. As an interdisciplinary research center anchored by federal programs and competitive private funding, the laboratory’s first responsibility is to meet the needs of the researchers within CNSE. External entities, including both on- and off-campus partners, are encouraged to collaborate with CNSE as long as there is instrument availability and proper confidentiality documentation has been signed. The MCAL’s instrumentation suite offers academic and industrial partners a unique set of analytical capabilities, which may assist them in accomplishing their project goals.

The MCAL’s analytical capabilities include elemental, compound, and molecular compositions that can be determined and cross-correlated for a wide variety of materials. Structural determination and stoichiometry for network solids is achievable, and thin films of varying thicknesses and compositions can be successfully analyzed. Advanced thermal and thermomechanical instrumentation is available for precise characterization of polymeric materials. Surface characterization techniques and measurements are also performed on a variety of advanced instrumentation.

A list of instrumentation and methods within the MCAL is provided below.

Click here for more information on MCAL's Analytical Services.

For further information regarding CNSE’s materials characterization capabilities and/or rates, please contact the MCAL Manager at (701) 231-5305 or by email.

Categories of Materials Characterization

Chromatographic/Separation Methods
GC-MS Series 6890/5973 Gas Chromatograph-Mass Spectrometer Hewlett-Packard
HPLC Series 1100 High Performance Liquid Chromatograph Agilent Technologies
LC-MS 4000 Q-Trap Liquid Chromatograph-Mass Spectrometer Applied Biosystems
     
Elemental Analysis
EA CHNS-932 Elemental Analyzer with VTF-900 Oxygen Analyzer LECO
XRF ZSX Primus X-Ray Flourescence Spectrometer Rigaku
     
Nanomechanical Testing
NI TriboIndenter (Nanomechanical Testing Apparatus) Hysitron
PT Insight Electromechanical Testing System / Pull Tester MTS
     
Particle Size Analysis
XRD D8 Discover with GADDS Multipurpose X-ray Diffractometer Bruker Advanced X-ray Solutions
     
Resonance Methods
NMR 400 MHz NMR Spectrometer with solid state capabilities JEOL
     
Spectroscopy
FTIR Vertex 70 Fourier Transform Infrared
Spectrometer
Bruker Optics
GC-MS Series 6890/5973 Gas Chromatograph-Mass Spectrometer Hewlett-Packard
LC-MS 4000 Q-Trap Liquid Chromatograph-Mass Spectrometer Applied Biosystems
MALDI-TOF Ultraflex Series II MALDI-TOF Mass Spectrometer Bruker Daltonics
NMR 400 MHz NMR Spectrometer with solid state capabilities JEOL
PALS Positron Annihilation Lifetime Spectrometer EG&G Ortec
RIS Aramis Confocal Raman Imaging System Horiba Jobin Yvon
     
Surface Characterization
AFM 5500 Atomic Force Microscope Agilent Technologies
CP P-15 Longscan Stylus/Contact Profiler KLA Tencor
OM SZX12 Stereo Microscope LEEDS Precision/Olympus
OP NT3300 Optical Profiler Veeco/Wyko
NI TriboIndenter (Nanomechanical Testing Apparatus) Hysitron
STM 5500 Atomic Force Microscope Agilent Technologies
     
Thermal Analysis
TGA Q500 Thermogravimetric Analyzer TA Instruments
DMA Q800 Dynamic Mechanical Analyzer TA Instruments
RHMTR ARES Rheometer TA Instruments
DSC Q1000 Modulated Differential Scanning Calorimeter TA Instruments
TMA Thermomechanical Analyzer 2940 TA Instruments
     
Thermomechanical Analysis
DMA Q800 Dynamic Mechanical Analyzer TA Instruments
RHMTR ARES Rheometer TA Instruments
TMA Thermomechanical Analyzer 2940 TA Instruments
     
Thin Film Analysis & Characterization
AFM 5500 Atomic Force Microscope Agilent Technologies
CP P-15 Longscan Stylus/Contact Profiler KLA Tencor
GIXD D8 Discover with GADDS Multipurpose X-ray Diffractometer Bruker Advanced X-ray Solutions
OM SZX12 Stereo Microscope LEEDS Precision/Olympus
OP NT3300 Optical Profiler Veeco/Wyko
NI TriboIndenter (Nanomechanical Testing Apparatus) Hysitron
STM 5500 Atomic Force Microscope Agilent Technologies
XRR D8 Discover with GADDS Multipurpose X-ray Diffractometer Bruker Advanced X-ray Solutions
     
X-ray Techniques
PXRD Ultima IV Powder X-Ray Diffactometer Rigaku
XIS XD7600NT X-ray Imaging System Dage Precision Industries
XRD D8 Discover with GADDS Multipurpose X-ray Diffractometer Bruker Advanced X-ray Solutions
XRF ZSX Primus X-Ray Flourescence Spectrometer Rigaku
XRR D8 Discover with GADDS Multipurpose X-ray Diffractometer Bruker Advanced X-ray Solutions
     

Materials Processing

Sample Preparation
BME 1 SimpliMet 1000 Automatic Mounting Press Buehler
BME 2 EcoMet 3000 Grinder/Polisher Buehler
BME 3 IsoMet 4000 Linear Precision Saw Buehler
     
Welding
OW 5H Orbital Welder Swagelok