Materials Characterization and
Analysis Laboratory(MCAL)
Overview
The Materials Characterization and Analysis Laboratory (MCAL) within the NDSU Center for Nanoscale Science and Engineering (CNSE) is composed of instrumentation clusters aimed at providing critical insight into the chemical and physical properties of a wide range of materials. As an interdisciplinary research center anchored by federal programs and competitive private funding, the laboratory’s first responsibility is to meet the needs of the researchers within CNSE. External entities, including both on- and off-campus partners, are encouraged to collaborate with CNSE as long as there is instrument availability and proper confidentiality documentation has been signed. The MCAL’s instrumentation suite offers academic and industrial partners a unique set of analytical capabilities, which may assist them in accomplishing their project goals.
The MCAL’s analytical capabilities include elemental, compound, and molecular compositions that can be determined and cross-correlated for a wide variety of materials. Structural determination and stoichiometry for network solids is achievable, and thin films of varying thicknesses and compositions can be successfully analyzed. Advanced thermal and thermomechanical instrumentation is available for precise characterization of polymeric materials. Surface characterization techniques and measurements are also performed on a variety of advanced instrumentation.
A list of instrumentation and methods within the MCAL is provided below.
Click here for more information on MCAL's Analytical Services.
For further information regarding CNSE’s materials characterization capabilities and/or rates, please contact the MCAL Manager at (701) 231-5305 or by email.
Categories of Materials Characterization
| Chromatographic/Separation Methods | ||
| CHDF | Capillary Hydrodynamic Fractionator 2000 | Matec Applied Sciences |
| GCMS | Series 6890/5973 GCMS | Hewlett-Packard |
| HPLC | Series 1100 High Performance Liquid Chromatography | Agilent Technologies |
| LCMS | 4000 Q-Trap Liquid Chromatography Mass Spectrometry | Applied Biosystems |
| Elemental Analysis | ||
| EA | CHNS-932 Elemental Analyzer with VTF-900 Oxygen Analyzer | LECO |
| Nanomechanical Testing | ||
| NI | TriboIndenter (Nanomechanical Testing Apparatus) | Hysitron |
| Particle Size Analysis | ||
| CHDF | Capillary HydroDynamic Fractionator 2000 | Matec Applied Sciences |
| XRD | D8 Discover with GADDS Multipurpose X-ray Diffractometer | Bruker Advanced X-ray Solutions |
| Resonance Methods | ||
| NMR | 400 MHz NMR Spectrometer with solid state capabilities | JEOL |
| Spectroscopy | ||
| FTIR | Vertex 70 Fourier Transform Infrared Spectrometer |
Bruker Optics |
| GCMS | Series 6890/5973 Gas Chromatography Mass Spectrometry | Hewlett-Packard |
| LCMS | 4000 Q-Trap Liquid Chromatography Mass Spectrometry | Applied Biosystems |
| MALDI-TOF | Ultraflex Series II MALDI-TOF Mass Spectrometer | Bruker Daltonics |
| NMR | 400 MHz NMR Spectrometer with solid state capabilities | JEOL |
| PALS | Positron Annihilation Lifetime Spectrometer | EG&G Ortec |
| Surface Characterization | ||
| AFM | 5500 Atomic Force Microscope | Agilent Technologies |
| CP | P-15 Longscan Stylus/Contact Profiler | KLA Tencor |
| OM | SZX12 Stereo Microscope | LEEDS Precision/Olympus |
| OP | NT3300 Optical Profiler | Veeco/Wyko |
| NI | TriboIndenter (Nanomechanical Testing Apparatus) | Hysitron |
| STM | 5500 Atomic Force Microscope | Agilent Technologies |
| Thermal Analysis | ||
| TGA | Q500 Thermogravimetric Analyzer | TA Instruments |
| DMA | Q800 Dynamic Mechanical Analyzer | TA Instruments |
| DSC | Q1000 Modulated Differential Scanning Calorimeter | TA Instruments |
| TMA | Thermomechanical Analyzer 2940 | TA Instruments |
| Thermomechanical Analysis | ||
| DMA | Q800 Dynamic Mechanical Analyzer | TA Instruments |
| TMA | Thermomechanical Analyzer 2940 | TA Instruments |
| Thin Film Analysis & Characterization | ||
| AFM | 5500 Atomic Force Microscope | Agilent Technologies |
| CP | P-15 Longscan Stylus/Contact Profiler | KLA Tencor |
| GIXD | D8 Discover with GADDS Multipurpose X-ray Diffractometer | Bruker Advanced X-ray Solutions |
| OM | SZX12 Stereo Microscope | LEEDS Precision/Olympus |
| OP | NT3300 Optical Profiler | Veeco/Wyko |
| NI | TriboIndenter (Nanomechanical Testing Apparatus) | Hysitron |
| STM | 5500 Atomic Force Microscope | Agilent Technologies |
| XRR | D8 Discover with GADDS Multipurpose X-ray Diffractometer | Bruker Advanced X-ray Solutions |
| X-ray Techniques | ||
| XIS | XD7600NT X-ray Imaging System | Dage Precision Industries |
| XRD | D8 Discover with GADDS Multipurpose X-ray Diffractometer | Bruker Advanced X-ray Solutions |
| XRR | D8 Discover with GADDS Multipurpose X-ray Diffractometer | Bruker Advanced X-ray Solutions |

